Design and Test of Computers: The Current State of Test Compression. /
Design and Test of Computers: The Current State of Test Compression. /
IEEE, IEEE Computer Society y IEEE Circuits and Systems Society
- Nueva Jersey, Estados Unidos: IEEE Computer Society 2008
- v. ; 27 cm.
- Bimensual
- March/April 2008, Vol. 25, No. 2
112-Guest Editors' Introduction: Progress in Test Compression. 114-Historical Perspective on Scan Compression. 122-VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. 132-UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. 142-Hierarchical Test Compression for SoC Designs. 150-Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. 160-Wireless System for Microwave Test Signal Generation. 168-An Illustrated Methodology for Analysis of Error Tolerance. 178-Device Model for Ballistic CNFETs Using the First Conducting Band. 188-Discussing DRAM and CMOS Scaling with Inventor Bob Dennard.
0740-7475
TECNOLOGÍA--PUBLICACIONES SERIADAS
/ D457
112-Guest Editors' Introduction: Progress in Test Compression. 114-Historical Perspective on Scan Compression. 122-VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. 132-UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. 142-Hierarchical Test Compression for SoC Designs. 150-Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. 160-Wireless System for Microwave Test Signal Generation. 168-An Illustrated Methodology for Analysis of Error Tolerance. 178-Device Model for Ballistic CNFETs Using the First Conducting Band. 188-Discussing DRAM and CMOS Scaling with Inventor Bob Dennard.
0740-7475
TECNOLOGÍA--PUBLICACIONES SERIADAS
/ D457
2251-8215
