Design and Test of Computers: Desing and Test for Reliability and Efficiency. /
Design and Test of Computers: Desing and Test for Reliability and Efficiency. /
IEEE, IEEE Computer Society y IEEE Circuits and Systems Society
- Nueva Jersey, Estados Unidos: IEEE Computer Society 2008
- v. ; 27cm.
- Bimensual
- November/December 2008, Vol. 25, No. 6
510-The State of ESL Design. 520-Advances in ESL Design. 528-Wafer Test Methods to Improve Semiconductor Die Reliability. 538-Wafer Test Methods to Improve Semiconductor Die Reliability. 549-Defect Tolerance for Nanoscale Crossbar-Based Devices. 560-A Systematic Approach to Memory Test Time Reduction. 572-Multisynchronous and Fully Asynchronous NoCs for GALS Architectures. 581-Application Scenarios in Streaming-Oriented Embedded-System Design. 590-Managing Security in FPGA-Based Embedded Systems.
0740-7475
TECNOLOGÍA--PUBLICACIONES SERIADAS
/ D457
510-The State of ESL Design. 520-Advances in ESL Design. 528-Wafer Test Methods to Improve Semiconductor Die Reliability. 538-Wafer Test Methods to Improve Semiconductor Die Reliability. 549-Defect Tolerance for Nanoscale Crossbar-Based Devices. 560-A Systematic Approach to Memory Test Time Reduction. 572-Multisynchronous and Fully Asynchronous NoCs for GALS Architectures. 581-Application Scenarios in Streaming-Oriented Embedded-System Design. 590-Managing Security in FPGA-Based Embedded Systems.
0740-7475
TECNOLOGÍA--PUBLICACIONES SERIADAS
/ D457
2251-8215
