Design and Test of Computers:   IEEE Std 1500 and Its Usage. / 
IEEE, IEEE Computer Society y IEEE Circuits and Systems Society 
 - Nueva Jersey​, Estados Unidos:  IEEE Computer Society,  2009 
 - v. ;  27 cm. 
 - Bimensual 
 - January/February , Vol. 26, No. 1 
<br/><br/>6-Guest Editors' Introduction: The Status of IEEE Std 1500. 8-IEEE Std 1500 Enables Modular SoC Testing. 18-Improved Core Isolation and Access for Hierarchical Embedded Test. 26-Turbo1500: Core-Based Design for Test and Diagnosis. 36-CTL and Its Usage in the EDA Industry. 44-The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper. 52-Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. 60-Algorithmic Concurrent Error Detection in Complex Digital-Processing Systems. 68-Logic Mapping in Crossbar-Based Nanoarchitectures. 78-A CMOS Resizing Methodology for Analog Circuits. 88-The Challenges of Nanotechnology and Gigacomplexity. 
<br/><br/><label>ISSN: </label>0740-7475 
<br/><br/><label>Subjects--Topical Terms: </label><br/>TECNOLOGÍA--PUBLICACIONES SERIADAS
<br/><br/><label>Dewey Class. No.: </label> / D457