TY  - SER
ED  - The Institute of Electrical and Electronics Engineers
TI  - Design and Test of Computers: : IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs. 
SN  - 0740-7475
PY  - 2007///
CY  - Nueva Jersey​, Estados Unidos
PB  - IEEE Computer Society 
KW  - TECNOLOGÍA
KW  - LEMB
KW  - PUBLICACIONES SERIADAS
N1  - 214-Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. 2016-A Production IR-Drop Screen on a Chip. 226-Modeling Power Supply Noise in Delay Testing. 236-Power Supply Noise in SoCs: Metrics, Management, and Measurement.  246-Power Grid Physics and Implications for CAD. 256-Analysis of Power Supply Noise in the Presence of Process Variations. 268-Scan-Based Tests with Low Switching Activity.  276-Power Droop Testing
ER  -