Design and Test of Computers:   Special Issue on Design and Test of Interconnects for Multicore Chips. / 
IEEE, IEEE Computer Society y IEEE Circuits and Systems Society 
 - Nueva Jersey​, Estados Unidos:  IEEE Computer Society   2008 
 - v. ;  27cm. 
 - Bimensual 
 - September/October 2008, Vol. 25, No. 5 
<br/><br/>398-ITC 2008 Highlights. 400-Guest Editors' Introduction: Tackling Key Problems in NoCs. 402-COSI: A Framework for the Design of Interconnection Networks. 416-A Quality-Driven Design Approach for NoCs. 430-Characterization of Equalized and Repeated Interconnects for NoC Applications. 442-An Interconnect Strategy for a Heterogeneous, Reconfigurable SoC. 452-Signal Integrity Enhancement in Digital Circuits. 462-Hardware-Software Approaches to In-Circuit Emulation for Embedded Processors. 478-Verification of Pin-Accurate Port Connections. 488-Designing Micro- and Nanosystems for a Safer and Healthier Tomorrow.  
<br/><br/><label>ISSN: </label>0740-7475 
<br/><br/><label>Subjects--Topical Terms: </label><br/>TECNOLOGÍA--PUBLICACIONES SERIADAS
<br/><br/><label>Dewey Class. No.: </label> / D457