TY  - SER
ED  - The Institute of Electrical and Electronics Engineers
TI  - Design and Test of Computers: : Desing and Test for Reliability and Efficiency. 
SN  - 0740-7475
PY  - 2008///
CY  - Nueva Jersey​, Estados Unidos
PB  - IEEE Computer Society 
KW  - TECNOLOGÍA
KW  - LEMB
KW  - PUBLICACIONES SERIADAS
N1  - 510-The State of ESL Design. 520-Advances in ESL Design. 528-Wafer Test Methods to Improve Semiconductor Die Reliability. 538-Wafer Test Methods to Improve Semiconductor Die Reliability. 549-Defect Tolerance for Nanoscale Crossbar-Based Devices. 560-A Systematic Approach to Memory Test Time Reduction. 572-Multisynchronous and Fully Asynchronous NoCs for GALS Architectures. 581-Application Scenarios in Streaming-Oriented Embedded-System Design. 590-Managing Security in FPGA-Based Embedded Systems
ER  -