Design and Test of Computers: Special Issue on Design and Test of Interconnects for Multicore Chips. / IEEE, IEEE Computer Society y IEEE Circuits and Systems Society
Tipo de material:
- 0740-7475
- D457
Contenidos:
398-ITC 2008 Highlights. 400-Guest Editors' Introduction: Tackling Key Problems in NoCs. 402-COSI: A Framework for the Design of Interconnection Networks. 416-A Quality-Driven Design Approach for NoCs. 430-Characterization of Equalized and Repeated Interconnects for NoC Applications. 442-An Interconnect Strategy for a Heterogeneous, Reconfigurable SoC. 452-Signal Integrity Enhancement in Digital Circuits. 462-Hardware-Software Approaches to In-Circuit Emulation for Embedded Processors. 478-Verification of Pin-Accurate Port Connections. 488-Designing Micro- and Nanosystems for a Safer and Healthier Tomorrow.
Tipo de ítem | Biblioteca actual | Colección | Signatura topográfica | Copia número | Estado | Código de barras | |
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Biblioteca Rafael Meza Ayau | Hemeroteca | D457 2008 (Navegar estantería(Abre debajo)) | 01 | Disponible | 68986 |
398-ITC 2008 Highlights. 400-Guest Editors' Introduction: Tackling Key Problems in NoCs. 402-COSI: A Framework for the Design of Interconnection Networks. 416-A Quality-Driven Design Approach for NoCs. 430-Characterization of Equalized and Repeated Interconnects for NoC Applications. 442-An Interconnect Strategy for a Heterogeneous, Reconfigurable SoC. 452-Signal Integrity Enhancement in Digital Circuits. 462-Hardware-Software Approaches to In-Circuit Emulation for Embedded Processors. 478-Verification of Pin-Accurate Port Connections. 488-Designing Micro- and Nanosystems for a Safer and Healthier Tomorrow.
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