IEEE Aerospace and Electronic Systems Magazine. / Institute of Electrical and Electronics Engineers (IEEE).
Tipo de material:
- 08858985
- IN59
Contenidos:
02-In this Issue-Technically. Column: 03-From the Editor-in-Chief. Articles: 04-Network System for Wide Area DGNSS. 09-GNSS Baseband Loggin System. 14-Test Results of an RR-Type Micromechanical Gyroscopye. 22-System Engineering Artifacts for SoS. 29-Test Forensics: A guide to Evaluating TPS Transportability. 35-What Can We Do to Stay Current with Technology. 40-The Real "Total Cost of Ownership" of Your Test Equipment...[etc]
Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras | |
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Biblioteca Rafael Meza Ayau | Hemeroteca | IN59 2011 (Navegar estantería(Abre debajo)) | 01 | Disponible | 49330 |
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02-In this Issue-Technically. Column: 03-From the Editor-in-Chief. Articles: 04-Network System for Wide Area DGNSS. 09-GNSS Baseband Loggin System. 14-Test Results of an RR-Type Micromechanical Gyroscopye. 22-System Engineering Artifacts for SoS. 29-Test Forensics: A guide to Evaluating TPS Transportability. 35-What Can We Do to Stay Current with Technology. 40-The Real "Total Cost of Ownership" of Your Test Equipment...[etc]
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