Vista normal Vista MARC Vista ISBD

Design and Test of Computers: Automated Source-Level Debugging. / IEEE, IEEE Computer Society y IEEE Circuits and Systems Society - Nueva Jersey​, Estados Unidos: IEEE Computer Society 2006 - v. ; 27cm. - Bimensual - January/February 2006, Vol. 23, No. 1

8-Automated Source-Level Error Localization in Hardware Designs. 20-MOSFET Mismatch Modeling: A New Approach. 30-Logic Design for Printability Using OPC Methods. 38-Early, Accurate Dependability Analysis of CAN-Based Networked Systems. 46-Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. 58-Efficient Parametric Fault Detection in Switched-Capacitor Filters.

ISSN: 0740-7475

Subjects--Topical Terms:
TECNOLOGÍA--PUBLICACIONES SERIADAS

Dewey Class. No.: / D457